Showing 1 - 11 of 11 Results
1.
Nanometer-Scale Defect Detection Using Polarized Light by Dahoo, Pierre-Richard, El H... ISBN: 9781848219366 List Price: $125.00
2.
Analysis of Failures of Embedded Mechatronic Systems, Volume 1 : Predictive Reliability by El Hami, Abdelkhalak, Pougn... ISBN: 9781785480133 List Price: $130.00
3.
Analysis of Failures of Embedded Mechatronic Systems, Volume 2 : Modeling, Simulation and Op... by El Hami, Abdelkhalak, Pougn... ISBN: 9781785480140 List Price: $130.00
4.
Applications and Metrology at Nanometer-Scale 1 : Smart Materials, Electromagnetic Waves and... by Dahoo, Pierre-Richard, Poug... ISBN: 9781119808244 List Price: $165.00
5.
Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering a... by Dahoo, Pierre-Richard, Poug... ISBN: 9781786306876 List Price: $165.00
6.
Applications and Metrology at Nanometer-Scale 1 : Smart Materials, Electromagnetic Waves and... by Dahoo, Pierre-Richard, Poug... ISBN: 9781786306401 List Price: $165.00
7.
Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering a... by Dahoo, Pierre-Richard, Poug... ISBN: 9781119818984 List Price: $165.00
8.
Nanometer-Scale Defect Detection Using Polarized Light by Dahoo, Pierre-Richard, Poug... ISBN: 9781119329633 List Price: $125.00
9.
Embedded Mechatronic Systems, Volume 2 by El Hami, Abdelkhalak, Pougn... ISBN: 9781785481901
10.
Embedded Mechatronic Systems, Volume 1 by El Hami, Abdelkhalak, Pougn... ISBN: 9781785481895
11.
Nanometer-scale Defect Detection Using Polarized Light by Dahoo, Pierre-richard, Poug... ISBN: 9781119329688