1.
Nanometer-Scale Defect Detection Using Polarized Light
by Dahoo, Pierre-Richard, El H...
ISBN: 9781848219366
List Price: $125.00
2.
Analysis of Failures of Embedded Mechatronic Systems, Volume 1 : Predictive Reliability
by El Hami, Abdelkhalak, Pougn...
ISBN: 9781785480133
List Price: $130.00
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Analysis of Failures of Embedded Mechatronic Systems, Volume 2 : Modeling, Simulation and Op...
by El Hami, Abdelkhalak, Pougn...
ISBN: 9781785480140
List Price: $130.00
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Applications and Metrology at Nanometer-Scale 1 : Smart Materials, Electromagnetic Waves and...
by Dahoo, Pierre-Richard, Poug...
ISBN: 9781119808244
List Price: $165.00
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Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering a...
by Dahoo, Pierre-Richard, Poug...
ISBN: 9781786306876
List Price: $165.00
6.
Applications and Metrology at Nanometer-Scale 1 : Smart Materials, Electromagnetic Waves and...
by Dahoo, Pierre-Richard, Poug...
ISBN: 9781786306401
List Price: $165.00
7.
Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering a...
by Dahoo, Pierre-Richard, Poug...
ISBN: 9781119818984
List Price: $165.00
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Nanometer-Scale Defect Detection Using Polarized Light
by Dahoo, Pierre-Richard, Poug...
ISBN: 9781119329633
List Price: $125.00
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10.
11.
Nanometer-scale Defect Detection Using Polarized Light
by Dahoo, Pierre-richard, Poug...
ISBN: 9781119329688