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64170948

9781786306876

Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method

Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method
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Product details

  • ISBN-13: 9781786306876
  • ISBN: 1786306875
  • Publication Date: 2021
  • Publisher: Wiley & Sons, Incorporated, John

AUTHOR

Dahoo, Pierre-Richard, Pougnet, Philippe, El Hami, Abdelkhalak

SUMMARY

Dahoo, Pierre-Richard is the author of 'Applications and Metrology at Nanometer-Scale 2 : Measurement Systems, Quantum Engineering and RBDO Method', published 2021 under ISBN 9781786306876 and ISBN 1786306875.

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