1.
Electromigration Modeling at Circuit Layout Level
by Tan, Cher Ming, He, Feifei
ISBN: 9789814451208
List Price: $69.95
2.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Spr...
by Tan, Cher Ming, Gan, Zhengh...
ISBN: 9780857293091
List Price: $129.00
3.
4.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
by Tan, Cher Ming, Li, Wei, Ga...
ISBN: 9781447126416
List Price: $159.00
5.
Microelectronic Yield, Reliability, and Advanced Packaging : 28-30 November 2000, Singapore
by Tan, Cher Ming, Society of ...
ISBN: 9780819439017
List Price: $80.00
OUT OF STOCK
See Availability on Amazon6.
7.
Reliability and Failure Analysis of High Power LED Packaging
by Tan, Cher Ming, Singh, Pree...
ISBN: 9780128224083
List Price: $200.00
8.
Theory and Practice of Quality and Reliability Engineering in Asia Industry
by Tan, Cher Ming, Goh, Thong ...
ISBN: 9789811032882
List Price: $199.00
9.
Theory and Practice of Quality and Reliability Engineering in Asia Industry
by Tan, Cher Ming, Goh, Thong ...
ISBN: 9789811098345
List Price: $279.99
12.