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34628801

9789814451208

Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level
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Product details

  • ISBN-13: 9789814451208
  • ISBN: 9814451207
  • Publication Date: 2013
  • Publisher: Springer

AUTHOR

Tan, Cher Ming, He, Feifei

SUMMARY

Tan, Cher Ming is the author of 'Electromigration Modeling at Circuit Layout Level', published 2013 under ISBN 9789814451208 and ISBN 9814451207.

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