1.
Design-For-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
by Noia, Brandon, Chakrabarty,...
ISBN: 9783319023779
List Price: $119.00
2.
Design-For-Test and Test Optimization Techniques for Tsv-Based 3D Stacked ICS
by Noia, Brandon, Chakrabarty,...
ISBN: 9783319345345
List Price: $119.00
OUT OF STOCK
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Design-For-Test and Test Optimization Techniques for Tsv-Based 3D Stacked ICS
by Noia, Brandon, Chakrabarty,...
ISBN: 9783319023793
List Price: $24.99