Showing 1 - 3 of 3 Results
1.
Design-For-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs by Noia, Brandon, Chakrabarty,... ISBN: 9783319023779 List Price: $119.00
2.
Design-For-Test and Test Optimization Techniques for Tsv-Based 3D Stacked ICS by Noia, Brandon, Chakrabarty,... ISBN: 9783319345345 List Price: $119.00
3.
Design-For-Test and Test Optimization Techniques for Tsv-Based 3D Stacked ICS by Noia, Brandon, Chakrabarty,... ISBN: 9783319023793 List Price: $24.99