1.
Thin Film Analysis by X-Ray Scattering
by Birkholz, Mario, Fewster, P...
ISBN: 9783527310524
List Price: $195.00
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Moderne Rntgenbeugung: Rntgendiffraktometrie fr Materialwissenschaftler, Physiker und Chemik...
by Lothar Spieß, Gerd Teichert...
ISBN: 9783835101661
List Price: $59.95