CartSellback ListOrder LookupSupport
ValoreBooks logo
Cancel
Showing 1 - 5 of 5 Results
1.
High Resolution X-Ray Diffraction and Topography
High Resolution X-Ray Diffraction and Topography by Bowen, D. Keith, Tanner, B. K. ISBN: 9780850667585 List Price: $119.95
$185.78
2.
Characterization of Crystal Growth Defects by X-Ray Methods (Applications of Communications ...
Characterization of Crystal Growth Defects by X-Ray Methods (Applications of Communications ... by Tanner, Brian K., Bowen, D.... ISBN: 9780306406287 List Price: $110.00

OUT OF STOCK

See Availability on Amazon
3.
Microscopy of materials: Modern imaging methods using electron, x-ray and ion beams
Microscopy of materials: Modern imaging methods using electron, x-ray and ion beams by D. Keith Bowen ISBN: 9780333154953

OUT OF STOCK

See Availability on Amazon
4.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing by Bowen, D. Keith, Tanner, Br... ISBN: 9781420005653

OUT OF STOCK

See Availability on Amazon
5.
Microscopy of materials: Modern imaging methods using electron, x-ray and ion beams
Microscopy of materials: Modern imaging methods using electron, x-ray and ion beams by D. Keith Bowen ISBN: 9780333187036

OUT OF STOCK

See Availability on Amazon