21354162

9786131563621

Effet du faible dbit de dose sur les technologies bipolaires: Vers le test de composants bipolaires pour des applications spatiales (French Edition)

Effet du faible dbit de dose sur les technologies bipolaires: Vers le test de composants bipolaires pour des applications spatiales (French Edition)
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  • ISBN-13: 9786131563621
  • ISBN: 6131563624
  • Publication Date: 2011
  • Publisher: Editions universitaires europeennes

AUTHOR

Jérôme Boch

SUMMARY

Jérôme Boch is the author of 'Effet du faible dbit de dose sur les technologies bipolaires: Vers le test de composants bipolaires pour des applications spatiales (French Edition)', published 2011 under ISBN 9786131563621 and ISBN 6131563624.

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