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48972639

9781975795610

X-ray diffraction: from basics to nanostructure determination (Chinese Edition)

X-ray diffraction: from basics to nanostructure determination (Chinese Edition)
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Product details

  • ISBN-13: 9781975795610
  • ISBN: 197579561X
  • Edition: 1
  • Publication Date: 2017
  • Publisher: CreateSpace Independent Publishing Platform

AUTHOR

Xu, Gu, Chen, Ping, Gu Xu, Ping Chen

SUMMARY

Xu, Gu is the author of 'X-ray diffraction: from basics to nanostructure determination (Chinese Edition)', published 2017 under ISBN 9781975795610 and ISBN 197579561X.

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