1876399
9780471493693
1. Elementary Crystallography.1-1 The Crystalline State.1-1.1 Crystalline and Amorphous Solids.1-1.2 Definition of a Crystal.1-1.3 Characteristics of the Crystalline and Vitreous States.1-2 Crystal Geometry.1-2.1 External Form and Habit of Crystals.1-2.2 Constancy of Interfacial Angles.1-2.3 Symmetry Elements of Crystals.1-2.4 Pseudosymmetry, 13.1-2.5 Crystallographic Axes.1-2.6 Axial Ratios.1-2.7 The Six Crystal Symmetry Systems.1-2.8 Miller Indices.1-2.9 The Law of Rational Indices.1-2.10 Crystal Forms.1-2.11 Composite Crystals and Twinning.1-2.12 Equation for the Plane (hkl).1-2.13 Zones and Zone Relationships.1-3 Space Lattices.1-3.1 Historical Introduction.1-3.2 Definition.1-3.3 The Unit Ceil.1-3.4 The 14 Bravais Lattices.1-3.5 Some Crystallographic Implications of Space Lattices.1-3.6 Distance between Neighboring Lattice Planes in the Series (hkl).1-3.7 The Reciprocal Lattice.1-4 Point Groups and Space Groups.1-4.1 The Point Group or Crystal Symmetry Class.1-4.2 The Space Group.General References.Specific References.2. The Production and Properties of X-rays.2-1 X-Ray Safety and Protection.2-2 The Production of X-Rays.2-2.1 The Origin of X-Rays.2-2.2 X-Ray Tubes.A. Gas tubes.B. Hot-cathode tubes.C. Modern diffraction tube design.D. Cold-cathode diffraction tubes.E. High-intensity diffraction tubes.F. Microfocus diffraction tubes.2-2.3 Power Equipment for the Production of X-rays.2-2.4 Commercial X-ray Generators for Diffraction.2-2.5 Isotopic X-ray Sources.2-3 Properties of X-Rays and their Measurement.2-3.1 The X-ray Spectrum of an Element.A. The continuous x-ray spectrum.B. The characteristic x-ray spectrum.2-3.2 The Precise Determination of X-ray Wavelengths.2-3.3 Absorption of X-rays.2-3.4 Secondary Fluorescent and Scattered X-rays.2-3.5 Refraction of X-rays.2-3.6 Monochromatization of X-radiation.A. Single filter technique.B. Balanced-filter technique.C. Crystal monochromator techniques.D. Graphite monochromators.2-3.7 The Photographic Effects of X-rays.General References.Specific References.3. Fundamental Principles of X-ray Diffraction.3-1 Kinematical and Dynamical Diffraction Theory.3-2 The Geometry of Diffraction.3-2.1 Scattering of X-rays by Electrons and Atoms.3-2.2 Scattering by a Regularly Spaced Row of Atoms.3-2.3 Conditions for Diffraction by a Linear Lattice of Atoms.3-2.4 Diffraction by a Simple Cubic Lattice.3-2.5 Proof that the "Diffracting Plane" is a Lattice Plane.3-2.6 The Bragg Equation.3-2.7 Derivation of the Bragg Equation from the "Reflection" Analogy.3-2.8 The Geometrical Picture of Diffraction in Reciprocal Space.3-3 The Intensity of Diffraction.3-3.1 Perfect and Imperfect Crystals.3-3.2 Primary and Secondary Extinction.3-3.3 Relative and Absolute Intensities.3-3.4 Factors Affecting the Diffraction Intensities.A. The polarization factor.B. The Lorentz and "velocity" factors.C. The temperature factor.D. The atomic scattering factor.E. The structure factor.F. The multiplicity factor.G. The absorption factor.3-3.5 Expressions for the Relative Intensity of Diffraction by the Various Techniques.3-3.6 Lattice-Centering and Space-Group Extinctions.General References.Specific References.4. Photographic Powder Techniques.4-1 The Debye-Scherrer Method.4-1.1 Introduction.4-1.2 Camera Design.A. General geometry.B. Details of camera construction.C. Camera support and alignment.4-1.3 Preparation of the Powder.4-1.4 Mounting the Powder.4-1.5 Making the Exposure.4-1.6 Processing the Film.4-2 Parafocusing Methods.4-3 Monochromatic-Pinhole Techniques.4-3.1 Forward-Reflection Method.4-3.2 Back-Reflection Method.4-4 Microcameras and Microbeam Techniques.4-5 High-Temperature Techniques.4-6 Low-Temperature Techniques.4-7 High-Pressure Techniques.General References.Specific References.Diffractometric Powder Technique.5-1 Geometry of the Powder Diffractometer.5-1.1 General Features.5-1.2 Details of the Optical Arrangement.5-1.3 The Seemann-Bohlin Diffractometer.5-1.4 Alignment and Angular Calibration of the Diffractometer.A. Operations appropriately performed in advance by the manufacturer.B. Further internal alignment of the goniometer.C. Alignment of the goniometer with respect to the x-ray tube.D. Calibration of the O? 2Theta; position.E. Calibration of angular registration between 0 and 180? 2Theta;.5-2 Profiles and positions of diffraction maxima.5-2.1 Convolution Synthesis of Line Profiles.A. X-ray source, g I .B. Flat specimen surface, g II .C. Axial divergence, g III .D. Specimen transparency, g IV .E. Receiving slit, g v .F. Comparison of calculated and experimental line profiles.5-2.2 Displacement and Breadth of Diffraction Maxima.A. Line position.B. Line breadth.C. The practical determination of the centroid and variance.5-2.3 Accurate Determination of Interplanar (d) Spacings.5-2.4 "Routine" Determination of Interplanar (d) Spacings.5-3 Electrical Characteristics of the Diffractometer.5-3.1 General Arrangement of Components.5-3.2 Radiation Detectors (Quantum Counters).A. Gas-ionization counters.B. Geiger-Muller counters.C. Proportional counters.D. Scintillation counters.E. Solid-state (energy-dispersive) detectors.5-3.3 Nonlinearity of Detector Response.5-3.4 Monochromatizing Techniques.A. Pulse-height discrimination and analysis.B. Ross balanced filters.C. Crystal monochromators.5-4 Choice of Experimental Conditions and Procedures.5-4.1 Statistical Accuracy of Counter Measurements.5-4.2 The Specimen.A. Preparation of powders.B. Rotation of the specimen.C. Preferred orientation and the specimen mount.D. High-temperature techniques.E. Low-temperature techniques.F. Other special specimen techniques.5-4.3 Transmission Techniques.5-4.4 Continuous-Scan Techniques.5-4.5 Step-Scan Techniques and Automation.General References.Specific References.6. The Interpretation of Powder Diffraction Data.6-1 The Viewing and Precision Measurement of Powder Photographs.6-2 Determination of Interplanar (d) Spacings.6-2.1 Debye-Scherrer Patterns, 424.6-2.2 Monochromatic-Pinhole (Flat-Film) Patterns, 435.6-3 Indexing Cubic Powder Patterns.6-3.1 Reciprocal-Lattice Picture of Diffraction by a Cubic Powder.6-3.2 Indexing a Cubic Pattern by sin 2 Theta; Ratios.6-3.3 Determination of the Unit-Cell Dimension a.6-3.4 Indexing a Cubic Pattern When a Is Known.6-4 Determination of Lattice Type.6-5 Indexing Noncubic Powder Patterns.6-5.1 Indexing Noncubic Patterns When the Unit-Cell Dimensions are Known.6-5.2 Graphical Methods of Indexing.6-5.3 Analytical Methods of Indexing: Tetragonal, Hexagonal, and Orthorhombic Patterns.6-5.4 Analytical Methods of Indexing: Monoclinic and Triclinic Patterns.6-6 Automated Computing Procedures for Indexing Powder Patterns.6-6.1 Programs for Patterns of Orthorhombic and Higher Symmetry.6-6.2 Programs for Patterns of Low Symmetry.6-7 The Measurement of Intensities from Photographic Blackening.6-7.1 Introduction.6-7.2 Preparation of a Graded Intensity Scale.6-7.3 Visual Estimation of Intensities.6-7.4 Photometer Techniques.6-8 The Measurement of Intensities with the X-Ray Diffractometer.6-9 Putting Intensities on an Absolute Scale.6-10 Special Scattering and Diffraction Effects.6-10.1 Background Effects.A. Background due to lattice imperfections.B. Background due to general radiation.C. Absorption discontinuities.D. Air scatter.E. Secondary fluorescence radiation.6-10.2 Reflections of Unusual CharKlug, Harold P. is the author of 'X-Ray Diffraction Procedures', published 1974 under ISBN 9780471493693 and ISBN 0471493694.
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