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9780123705976

VLSI Test Principles And Architectures Design for Testability

VLSI Test Principles And Architectures Design for Testability
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  • Comments: New. In shrink wrap. Looks like an interesting title!
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Product details

  • ISBN-13: 9780123705976
  • ISBN: 0123705975
  • Publication Date: 2006
  • Publisher: Morgan Kaufmann Pub

AUTHOR

Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing

SUMMARY

Covering VLSI testing from digital, analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits, this edited work discusses future test technology trends and challenges facing the nanometer design era, including how to deal with physical failures and soft errors.Wang, Laung-Terng is the author of 'VLSI Test Principles And Architectures Design for Testability', published 2006 under ISBN 9780123705976 and ISBN 0123705975.

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