by Sabnis, Anant G., Einspruch, Norman G.

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ISBN-13: 9780122341229
ISBN: 0122341228
Publisher: Elsevier Science & Technology Books

AUTHOR

Sabnis, Anant G., Einspruch, Norman G.

SUMMARY

As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging. Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualificationSabnis, Anant G. is the author of 'Vlsi Reliability' with ISBN 9780122341229 and ISBN 0122341228.

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