Thin Films Stresses and Mechanical Properties IX Materials Research Society Symposium Proceedings

This volume, the ninth in a popular series from the Materials Research Society, is strengthened by invited and contributed papers covering a wide range of subjects, from processing-microstructure-mechanical property relationships, strain effects and self-organization in thin films, nanoscale defects and thermomechanical behavior of materials, to novel nanoscale materials testing. While the collection continues the series theme of materials-science-related modeling and characterization of mechanical properties of materials, special focus is given to: strain relaxation and strengthening mechanisms; defects formation; mechanical properties and nanoscale testing; adhesion and fracture; thin-film applications in MEMS; computational modeling and experiments; and film deposition, microstructure, evolution and intrinsic stress.Ozkan, C. S. is the author of 'Thin Films Stresses and Mechanical Properties IX Materials Research Society Symposium Proceedings' with ISBN 9781558996311 and ISBN 1558996311.