6471694
9789812778819
Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.Nakamura, Takashi is the author of 'Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices', published 2007 under ISBN 9789812778819 and ISBN 9812778810.
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