4386607
9780521017534
Focusing on polymeric materials, David Briggs offers an in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS).Briggs, D. is the author of 'Surface Analysis of Polymers by XPS And Static SIMS ', published 0018 under ISBN 9780521017534 and ISBN 052101753X.
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