Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy

Name: Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
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Author: Stanley J. Ness
ISBN: 9781286862377

by Stanley J. Ness

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ISBN-13: 9781286862377
ISBN: 128686237X
Publication Date: 2012
Publisher: BiblioScholar

AUTHOR

Stanley J. Ness

SUMMARY

Stanley J. Ness is the author of 'Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy', published 2012 under ISBN 9781286862377 and ISBN 128686237X.

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