1643474

9783540664598

Static Analysis 6th International Symposium, Sas'99, Venice, Italy, September 22-24, 1999 Proceedings

Static Analysis 6th International Symposium, Sas'99, Venice, Italy, September 22-24, 1999  Proceedings
$52.33
$3.95 Shipping
List Price
$74.95
Discount
30% Off
You Save
$22.62

  • Condition: New
  • Provider: LightningBooks Contact
  • Provider Rating:
    85%
  • Ships From: Multiple Locations
  • Shipping: Standard, Expedited (tracking available)
  • Comments: Fast shipping! All orders include delivery confirmation.

seal  

Ask the provider about this item.

Most renters respond to questions in 48 hours or less.
The response will be emailed to you.
Cancel
  • ISBN-13: 9783540664598
  • ISBN: 3540664599
  • Publication Date: 1999
  • Publisher: Springer

AUTHOR

Cortesi, Agostino, File, Gilberto

SUMMARY

This book constitutes the refereed proceedings of the 6th International Symposium on Static Analysis, SAS'99, held in Venice, Italy in September 1999. The 18 revised full papers presented together with five invited contributions, were carefully reviewed and selected from 42 submissions. The book presents the state of the art in Static Analysis. The papers are organized in sections on synchronization in Java programs, synchronous languages, abstract domains, concurrency, static single assignment, and foundations.Cortesi, Agostino is the author of 'Static Analysis 6th International Symposium, Sas'99, Venice, Italy, September 22-24, 1999 Proceedings', published 1999 under ISBN 9783540664598 and ISBN 3540664599.

[read more]

Questions about purchases?

You can find lots of answers to common customer questions in our FAQs

View a detailed breakdown of our shipping prices

Learn about our return policy

Still need help? Feel free to contact us

View college textbooks by subject
and top textbooks for college

The ValoreBooks Guarantee

The ValoreBooks Guarantee

With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.