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9783030516123

Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques

Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques
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Product details

  • ISBN-13: 9783030516123
  • ISBN: 3030516121
  • Publication Date: 2021
  • Publisher: Springer International Publishing AG

AUTHOR

Ghavami, Behnam, Raji, Mohsen

SUMMARY

Ghavami, Behnam is the author of 'Soft Error Reliability of VLSI Circuits : Analysis and Mitigation Techniques', published 2021 under ISBN 9783030516123 and ISBN 3030516121.

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