Secondary Ion Mass Spectrometry SIMS-II: Proceedings of the Second International Conference, Stanford University, Stanford, California, USA, August 17-31, 1979 (Springer Series in Chemical Physics)

Name: Secondary Ion Mass Spectrometry SIMS-II: Proceedings of the Second International Conference, Stanford University, Stanford, California, USA, August 17-31, 1979 (Springer Series in Chemical Physics)
Price: 51.00 USD
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ISBN: 9783540098430

by Benninghoven, A., Evans, C. A., Powell, R. A.

Secondary Ion Mass Spectrometry SIMS-II: Proceedings of the Second International Conference, Stanford University, Stanford, California, USA, August 17-31, 1979 (Springer Series in Chemical Physics)

by Benninghoven, A., Evans, C. A., Powell, R. A.

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ISBN-13: 9783540098430
ISBN: 3540098437
Edition: 1
Publication Date: 1980
Publisher: Springer

AUTHOR

Benninghoven, A., Evans, C. A., Powell, R. A.

SUMMARY

Benninghoven, A. is the author of 'Secondary Ion Mass Spectrometry SIMS-II: Proceedings of the Second International Conference, Stanford University, Stanford, California, USA, August 17-31, 1979 (Springer Series in Chemical Physics)', published 1980 under ISBN 9783540098430 and ISBN 3540098437.

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