Scanning Tunneling Microscopy and Its Application

This book presents a unified view of the rapidly growing field of STM and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and methods for tip and surface preparations, the monograph provides detailed accounts of STM applications. The new edition examines the limitations of the present-day investigations, predicts trends, and incorporates the latest research.Bai, C. is the author of 'Scanning Tunneling Microscopy and Its Application' with ISBN 9783540593461 and ISBN 3540593462.