5312413
9780387333250
Scanning Microscopy for Nanotechnology Techniques And Applications
by Zhou, Weilie, Wang, Zhong Lin
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- Condition: New
- Provider: Bookjunction Contact
- Provider Rating: 73%
- Ships From: STERLING HEIGHTS, MI
- Shipping: Standard
- Comments: New, US edition. Satisfaction guaranteed!!
Product details
- ISBN-13: 9780387333250
- ISBN: 0387333258
- Publication Date: 2006
- Publisher: Springer
AUTHOR
SUMMARY
Covering topics such as nanomaterials imaging, X-ray microanalysis, high resolution SEM, as well as techniques including electron back scatter diffracation (EBSD) and scanning transmission electron microscopy (STEM), this book is useful for nanomaterials researchers, as well as SEM development specialists.Zhou, Weilie is the author of 'Scanning Microscopy for Nanotechnology Techniques And Applications', published 2006 under ISBN 9780387333250 and ISBN 0387333258.
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