38665107
9781461276531
Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists
by Patrick Echlin, Charles E. Lyman, David C. Joy, Alton D. Romig Jr., Joseph Goldstein, Eric Lifshin, Dale E. Newbury, Charles Fiori
31245
About this item
- Condition: New
- Provider: LightningBooks
- Provider Rating: 85%
- Ships From: Multiple Locations
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Product details
- ISBN-13: 9781461276531
- ISBN: 1461276535
- Edition: 2nd ed. 1992. Softcover reprint of the original 2nd ed. 1992
- Publication Date: 2011
- Publisher: Springer
AUTHOR
SUMMARY
Patrick Echlin is the author of 'Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists', published 2011 under ISBN 9781461276531 and ISBN 1461276535.
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