1516531
9781402012587
Risk Methodologies for Technological Legacies
by Bley, Dennis, Droppo, James G., Eremenko, Vitaly A.
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Product details
- ISBN-13: 9781402012587
- ISBN: 1402012586
- Publisher: Springer
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SUMMARY
This conference focused on facility risk management & human-centred risk management as applied to remedial action against sites contaminated with radioactive waste materials.Bley, Dennis is the author of 'Risk Methodologies for Technological Legacies' with ISBN 9781402012587 and ISBN 1402012586.
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