8448008
9789814277105
Reliability and Radiation Effects in Compound Semiconductors
by Johnston, Allan H.
67753
List Price
Discount
9% Off
You Save
$9.05
About this item
- Condition: New
- Provider: buybestbooks15 Contact
- Provider Rating: 41%
- Ships From: STERLING HEIGHTS, MI
- Shipping: Standard
- Comments: New Book Original US edition, We Ship to PO BOX Address also.
72212
About this item
- Condition: Acceptable
- Provider: Read A Book Contact
- Provider Rating: 81%
- Ships From: Multiple Locations
- Shipping: Standard
- Comments: IMP: Acceptable- Do not include ACCESS CODE, CD-ROM or companion materials even if stated in item title. It may contain highlighting/markings throughout, and the covers and corners may show shelf wear. Corners, pages may be dent. All text is legible. 27
Product details
- ISBN-13: 9789814277105
- ISBN: 981427710X
- Publication Date: 2010
- Publisher: World Scientific Publishing Company, Incorporated
AUTHOR
SUMMARY
Johnston, Allan H. is the author of 'Reliability and Radiation Effects in Compound Semiconductors', published 2010 under ISBN 9789814277105 and ISBN 981427710X.
[read more]
The ValoreBooks Guarantee
With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.
