7410996
9780471280286
Reliability and Degradation: Semiconductor Devices and Circuits (The Wiley series in solid state devices & circuits)
by Howes, M. J., Morgan, D. V.
About this item
- Condition: Good
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- Provider Rating: 100%
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- Comments: This book, with its worn spine, annotated pages, and rich history, is a prime example of how second-hand literature can offer more than just a story. It provides a tangible connection to the past, a glimpse into the lives of previous readers, and a practical resource for current ones. Despite its imperfections, or perhaps because of them, this book stands as a valuable and meaningful addition to any reader's collection. By embracing its condition and the journey it represents, we can appreciate the deeper n
Product details
- ISBN-13: 9780471280286
- ISBN: 0471280283
- Publication Date: 1981
- Publisher: Wiley & Sons, Incorporated, John
AUTHOR
SUMMARY
Interaction of Metal Films on Semiconductors (S. D. Mukherjee). Mechanisms and Interfacial Layers in Silicide Formation (G. Ottaviani and J. W. Mayer). Interdiffusion of Metal Films on Gallium Arsenide and Indium Phosphide (D. V. Morgan). Reliability and Degradation of Silicon Devices and Integrated Circuits (J. Wood). Reliability and Degradation of Active III-V Semiconductor Devices (J. E. Davey and A. Christou). Reliability and Degradation of Lasers and Leds (D. H. Newman and S. Ritchie). Reliability and Degradation of Microwave Integrated Circuits (A. G. Van Nie, W. Goodblood, and G. Kersuzan). Index.Howes, M. J. is the author of 'Reliability and Degradation: Semiconductor Devices and Circuits (The Wiley series in solid state devices & circuits)', published 1981 under ISBN 9780471280286 and ISBN 0471280283.
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