1459555
9780824795542
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.Ron Jenkins is the author of 'Quantitative X-Ray Spectrometry, Second Edition, (Practical Spectroscopy)', published 1995 under ISBN 9780824795542 and ISBN 0824795547.
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