Progress in Transmission Electron Microscopy 2 Applications in Materials Science

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.Zhang, Xiao-Feng is the author of 'Progress in Transmission Electron Microscopy 2 Applications in Materials Science' with ISBN 9783540676812 and ISBN 3540676813.