1442923
9783540676805
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.Zhang, Xiao-Feng is the author of 'Progress in Transmission Electron Microscopy 1 Concepts and Techniques' with ISBN 9783540676805 and ISBN 3540676805.
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