Principles of Semiconductor Testing Test and Measurement Series

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. this book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.Afshar, Amir is the author of 'Principles of Semiconductor Testing Test and Measurement Series' with ISBN 9780750694728 and ISBN 0750694726.