1415878
9781402072352
The authors focus on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. This book surveys existing methods & presents several test automation techniques for reducing power in scan-based sequential circuits.Nicolici, Nicola is the author of 'Power-Constrained Testing of Vlsi Circuits' with ISBN 9781402072352 and ISBN 140207235X.
[read more]