26047536
9781441953155
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)
by Nicola Nicolici, Bashir M. Al-Hashimi
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- Condition: New
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Product details
- ISBN-13: 9781441953155
- ISBN: 1441953159
- Edition: Softcover reprint of the original 1st ed. 2003
- Publication Date: 2010
- Publisher: Springer
AUTHOR
SUMMARY
Nicola Nicolici is the author of 'Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing)', published 2010 under ISBN 9781441953155 and ISBN 1441953159.
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