44372109
9783319398075
Pitfalls in Diagnostic Cytopathology with Key Differentiating Cytologic Features
by Samedi, Von G., Bocklage, Th�r�se
370333
About this item
- Condition: Good
- Provider: Bonita
- Provider Rating: 0%
- Ships From: Multiple Locations
- Shipping: Standard
- Comments: Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Product details
- ISBN-13: 9783319398075
- ISBN: 3319398075
- Publication Date: 2016
- Publisher: Springer
AUTHOR
SUMMARY
Samedi, Von G. is the author of 'Pitfalls in Diagnostic Cytopathology with Key Differentiating Cytologic Features', published 2016 under ISBN 9783319398075 and ISBN 3319398075.
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