43418553

9780199946457

Patterns of Modern Chinese History

Patterns of Modern Chinese History
$73.95
$3.95 Shipping
  • Condition: New
  • Provider: LightningBooks Contact
  • Provider Rating:
    85%
  • Ships From: Multiple Locations
  • Shipping: Standard, Expedited (tracking available)
  • Comments: Fast shipping! All orders include delivery confirmation.

seal  
$36.82
$3.95 Shipping
List Price
$39.95
Discount
7% Off
You Save
$3.13

  • Condition: Acceptable
  • Provider: Read A Book Contact
  • Provider Rating:
    81%
  • Ships From: Multiple Locations
  • Shipping: Standard
  • Comments: IMP: Acceptable- Do not include ACCESS CODE, CD-ROM or companion materials even if stated in item title. It may contain highlighting/markings throughout, and the covers and corners may show shelf wear. Corners, pages may be dent. All text is legible. 27

seal  
$18.59
$3.95 Shipping

Your due date: 5/31/2025

$39.95
List Price
$39.95
Discount
53% Off
You Save
$21.36

  • Condition: Acceptable
  • Provider: GoTextbooks Contact
  • Provider Rating:
    78%
  • Ships From: Little Rock, AR
  • Shipping: Standard

seal  

Ask the provider about this item.

Most renters respond to questions in 48 hours or less.
The response will be emailed to you.
Cancel
  • ISBN-13: 9780199946457
  • ISBN: 0199946450
  • Publication Date: 2016
  • Publisher: Oxford University Press, Incorporated

AUTHOR

Desnoyers, Charles

SUMMARY

Desnoyers, Charles is the author of 'Patterns of Modern Chinese History', published 2016 under ISBN 9780199946457 and ISBN 0199946450.

[read more]

Questions about purchases?

You can find lots of answers to common customer questions in our FAQs

View a detailed breakdown of our shipping prices

Learn about our return policy

Still need help? Feel free to contact us

View college textbooks by subject
and top textbooks for college

The ValoreBooks Guarantee

The ValoreBooks Guarantee

With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.