2025258
9783540206620
A basic introduction to the field of nanoscale measurement of ferroelectric materials using scanning probe microscopy. It addresses imaging mechanisms and quantitative analysis in piezoelectric scanning probe microscopy as well as basic physics at nanoscale level in ferroelectrics.Alexe, M. is the author of 'Nanoscale Characterisation of Ferroelectric Materials Scanning Probe Microscopy Approach', published 2004 under ISBN 9783540206620 and ISBN 3540206620.
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