32516017

9783659165603

In situ testing of thin-film multi junction photovoltaic degradation: A development of a measurement process, data based potential comparison of second generation PVs

In situ testing of thin-film multi junction photovoltaic degradation: A development of a measurement process, data based potential comparison of second generation PVs
$46.23
$3.95 Shipping
List Price
$61.00
Discount
24% Off
You Save
$14.77

  • Condition: New
  • Provider: LightningBooks Contact
  • Provider Rating:
    85%
  • Ships From: Multiple Locations
  • Shipping: Standard, Expedited (tracking available)
  • Comments: Fast shipping! All orders include delivery confirmation.

seal  

Ask the provider about this item.

Most renters respond to questions in 48 hours or less.
The response will be emailed to you.
Cancel
  • ISBN-13: 9783659165603
  • ISBN: 3659165603
  • Publication Date: 2012
  • Publisher: LAP LAMBERT Academic Publishing

AUTHOR

György Szentannai

SUMMARY

György Szentannai is the author of 'In situ testing of thin-film multi junction photovoltaic degradation: A development of a measurement process, data based potential comparison of second generation PVs', published 2012 under ISBN 9783659165603 and ISBN 3659165603.

[read more]

Questions about purchases?

You can find lots of answers to common customer questions in our FAQs

View a detailed breakdown of our shipping prices

Learn about our return policy

Still need help? Feel free to contact us

View college textbooks by subject
and top textbooks for college

The ValoreBooks Guarantee

The ValoreBooks Guarantee

With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.