32134666
9781478268017
Improved Analysis of DNA Short Tandem Repeats with Time-Of-Flight Mass Spectrometry
by Butler, John, Becker, Christopher, Justice, U. S. Department
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- Condition: New
- Provider: LightningBooks
- Provider Rating: 85%
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About this item
- Condition: Good
- Provider: Bonita
- Provider Rating: 0%
- Ships From: Multiple Locations
- Shipping: Standard
- Comments: Access codes and supplements are not guaranteed with used items. May be an ex-library book.
Product details
- ISBN-13: 9781478268017
- ISBN: 1478268018
- Publication Date: 2012
- Publisher: CreateSpace Independent Publishing Platform
AUTHOR
SUMMARY
Butler, John is the author of 'Improved Analysis of DNA Short Tandem Repeats with Time-Of-Flight Mass Spectrometry', published 2012 under ISBN 9781478268017 and ISBN 1478268018.
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