962950
9780890067260
This book discusses in detail the correlation between physical defects and logic faults, and shows you how Iddq testing locates these defects. The book provides planning guidelines and optimization methods and is illustrated with numerous examples ranging from simple circuits to extensive case studies.Rajsuman, Rochit is the author of 'Iddq Testing for Cmos Vlsi' with ISBN 9780890067260 and ISBN 0890067260.
[read more]