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9780471914341

Failure Mechanisms in Semiconduct.dev.

Failure Mechanisms in Semiconduct.dev.
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Product details

  • ISBN-13: 9780471914341
  • ISBN: 0471914347
  • Publisher: Wiley & Sons, Incorporated, John

AUTHOR

Amerasekera, E. A., Campbell, D. S.

SUMMARY

Reliability Theory. Failure Mechanisms. Extrinsic Failure Mechanisms. Failure Mechanisms and Device Technologies. Packing. Screening. Accelerated Testing. Physical Failure Analysis Techniques. Reliability Prediction and Failure Modelling. Quality Assurance. Conclusions. Appendixes.Amerasekera, E. A. is the author of 'Failure Mechanisms in Semiconduct.dev.' with ISBN 9780471914341 and ISBN 0471914347.

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