21878409
9781558997875
From the imaging and spectroscopy of individual dopant atoms and clusters buried inside a semiconductor host, to the three-dimensional tomography of nanoparticles, virii, and biological structures and the in situ observations of nanomechanical deformation and electrodeposition, advances in instrumentation and algorithms have dramatically changed the field of electron microscopy.Martin, David C. is the author of 'Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure: Volume 839 (MRS Proceedings)', published 2005 under ISBN 9781558997875 and ISBN 1558997873.
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