691123
9780306443602
This is the first comprehensive volume on electron beam testing for integrated circuits. Including introductory material, a guide to fundamentals, and an implementational section, the work will serve as a complete reference for both experienced practitioners as well as those unfamiliar with the technology.Thong, J. T. is the author of 'Electron Beam Testing Technology' with ISBN 9780306443602 and ISBN 0306443600.
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