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9780471584896

Electromigration and Electronic Device Degradation

Electromigration and Electronic Device Degradation
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Product details

  • ISBN-13: 9780471584896
  • ISBN: 0471584894
  • Publisher: Wiley & Sons, Incorporated, John

AUTHOR

Christou, Aris

SUMMARY

Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.Christou, Aris is the author of 'Electromigration and Electronic Device Degradation' with ISBN 9780471584896 and ISBN 0471584894.

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