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35224682

9781461375616

Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits
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Product details

  • ISBN-13: 9781461375616
  • ISBN: 1461375614
  • Publication Date: 2012
  • Publisher: Springer

AUTHOR

Krstic, Angela, Kwang-Ting (Tim) Cheng

SUMMARY

Krstic, Angela is the author of 'Delay Fault Testing for VLSI Circuits', published 2012 under ISBN 9781461375616 and ISBN 1461375614.

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