61469177

9781734497342

Course Slides for Quantitative Research Methods Using Risk Simulator and ROV BizStats Software: Applying Econometrics, Multivariate Regression, ... Risk Simulation, and Predictive Modeling

Course Slides for Quantitative Research Methods Using Risk Simulator and ROV BizStats Software: Applying Econometrics, Multivariate Regression, ... Risk Simulation, and Predictive Modeling
$41.11
$3.95 Shipping
List Price
$50.00
Discount
17% Off
You Save
$8.89

  • Condition: New
  • Provider: LightningBooks Contact
  • Provider Rating:
    85%
  • Ships From: Multiple Locations
  • Shipping: Standard, Expedited (tracking available)
  • Comments: Fast shipping! All orders include delivery confirmation.

seal  
$106.04
$3.95 Shipping
  • Condition: Good
  • Provider: Bonita Contact
  • Provider Rating:
    0%
  • Ships From: Multiple Locations
  • Shipping: Standard
  • Comments: Access codes and supplements are not guaranteed with used items. May be an ex-library book.

seal  

Ask the provider about this item.

Most renters respond to questions in 48 hours or less.
The response will be emailed to you.
Cancel
  • ISBN-13: 9781734497342
  • ISBN: 1734497343
  • Publication Date: 2017
  • Publisher: ROV Press

AUTHOR

Dr. Johnathan Mun

SUMMARY

Dr. Johnathan Mun is the author of 'Course Slides for Quantitative Research Methods Using Risk Simulator and ROV BizStats Software: Applying Econometrics, Multivariate Regression, ... Risk Simulation, and Predictive Modeling', published 2017 under ISBN 9781734497342 and ISBN 1734497343.

[read more]

Questions about purchases?

You can find lots of answers to common customer questions in our FAQs

View a detailed breakdown of our shipping prices

Learn about our return policy

Still need help? Feel free to contact us

View college textbooks by subject
and top textbooks for college

The ValoreBooks Guarantee

The ValoreBooks Guarantee

With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.