483183
9780815512004
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field.McGuire, Gary E. is the author of 'Characterization of Semiconductor Materials Principles and Methods' with ISBN 9780815512004 and ISBN 0815512007.
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