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39484165

9781475711288

Characterization of Crystal Growth Defects by X-Ray Methods (Nato Science Series B:)

Characterization of Crystal Growth Defects by X-Ray Methods (Nato Science Series B:)
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Product details

  • ISBN-13: 9781475711288
  • ISBN: 147571128X
  • Edition: 1980
  • Publication Date: 2012
  • Publisher: Springer

AUTHOR

B.K. Tanner

SUMMARY

B.K. Tanner is the author of 'Characterization of Crystal Growth Defects by X-Ray Methods (Nato Science Series B:)', published 2012 under ISBN 9781475711288 and ISBN 147571128X.

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