483153
9780124759848
This book focuses on the basic principles of real-space imaging and diffraction techniques for quantitative characterization of the rough surfaces, following a detailed description of the characteristics of random rough surfaces. The book includes the latest development on the characterization and measurements of a wide variety of amorphous and crystalline rough surfaces. The complementary nature of the real-space and diffraction techniques is fully displayed. The book will be useful for academic researchers and industrial scientists interested in surface and interface structures and their applications in thin film growth, optical coating, plasma etching, patterning, machining, polishing, fracture, and tribology.Zhao, Y-P is the author of 'Characterization of Amorphous and Crystalline Rough Surface Principles and Applications' with ISBN 9780124759848 and ISBN 012475984X.
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