21445626

9786131502002

Caractrisation l'chelle nanomtrique d'interfaces mtal/SiOxNy: Etude de l'environnement physico-chimique des atomes localiss l'interface ... de Si, SiO2, ou Si3N4 (French Edition)

Caractrisation  l'chelle nanomtrique d'interfaces mtal/SiOxNy: Etude de l'environnement physico-chimique des  atomes localiss  l'interface ... de Si, SiO2, ou Si3N4 (French Edition)
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  • ISBN-13: 9786131502002
  • ISBN: 6131502005
  • Publication Date: 2011
  • Publisher: Éditions universitaires européennes

AUTHOR

Ignace Jarrige

SUMMARY

Ignace Jarrige is the author of 'Caractrisation l'chelle nanomtrique d'interfaces mtal/SiOxNy: Etude de l'environnement physico-chimique des atomes localiss l'interface ... de Si, SiO2, ou Si3N4 (French Edition)', published 2011 under ISBN 9786131502002 and ISBN 6131502005.

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