3968362
9780306442490
Advances in X-Ray Analysis
by Barrett, Charles S., Gilfrich, J. V., Huang, T. C.
About this item
- Condition: New
- Provider: buybestbooks15 Contact
- Provider Rating: 41%
- Ships From: STERLING HEIGHTS, MI
- Shipping: Standard
- Comments: New Book Original US edition, We Ship to PO BOX Address also.
Product details
- ISBN-13: 9780306442490
- ISBN: 0306442493
- Publication Date: 1992
- Publisher: Springer
AUTHOR
SUMMARY
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.Barrett, Charles S. is the author of 'Advances in X-Ray Analysis ', published 1992 under ISBN 9780306442490 and ISBN 0306442493.
[read more]
The ValoreBooks Guarantee
With our dedicated customer support team, you can rest easy knowing that we're doing everything we can to save you time, money, and stress.
