277573
9783540667186
Advances in Scanning Probe Microscopy
by Sakurai, T., Watanabe, Y.
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- Condition: New
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Product details
- ISBN-13: 9783540667186
- ISBN: 3540667180
- Publisher: Springer
AUTHOR
SUMMARY
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors & atomic manipulation for future single-electron devices.Sakurai, T. is the author of 'Advances in Scanning Probe Microscopy' with ISBN 9783540667186 and ISBN 3540667180.
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