Advances in Imaging And Electron Physics Electron-bean-induced Nanometer-scale Deposition

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.Hawkes, Peter W. is the author of 'Advances in Imaging And Electron Physics Electron-bean-induced Nanometer-scale Deposition', published 2006 under ISBN 9780120147854 and ISBN 0120147858.